National Instruments Announces Sixth Annual Virtual Automated Test Summit
NEWS RELEASE – April 21, 2009 – National Instruments today announced the 2009 Virtual Automated Test Summit, a free technical event that will be hosted on May 20 by National Instruments and other premier companies including Averna, Cal-Bay Systems, Cyth Systems, Microsoft and VI Technologies. This online event includes two live keynotes, five application-focused exhibition pavilions that are new to the show, 25 on-demand sessions organized into five technical workshops and more than 15 vendor exhibition booths. The Virtual Automated Test Summit offers expert-led training focused on applying best practices from the top trends in test and measurement which include software-defined instrumentation, parallel processing techniques and new methods for wireless and semiconductor test.
“At the Virtual Automated Test Summit, engineers will learn proven strategies for testing their devices more efficiently by applying technologies such as software-defined instrumentation, FPGAs and multicore processing that reduce costs, maximize performance and offer more flexibility for test and measurement systems,” said Eric Starkloff, vice president of product marketing for test and measurement at National Instruments. “This venue offers attendees technical presentations, real-world application examples and sessions covering everything from test system best practices to RF and wireless standards testing – all from the convenience of their desks.”
The event will begin with a “Top Trends Changing the Face of Automated Test in 2009” keynote at 11:00 a.m. CDT from Richard McDonell, senior group manager of product marketing for test and measurement at National Instruments. Additionally, the Virtual Automated Test Summit includes an afternoon keynote on “Lean Innovation: Testing in a Tough Economy” that will cover strategies for finding ways to stay innovative despite decreasing budgets.
And for the first time, the Virtual Automated Test Summit will feature industry pavilions for the RF and wireless, semiconductor, aerospace and defense, audio and video and automotive application areas where attendees can meet with domain experts and download technical resources consisting of whitepapers, reference architectures and discounted product bundles.
Starting at 10:30 a.m. CDT, attendees can log-in and interact real-time with industry experts while navigating the expo floor and watch on-demand, interactive sessions until 4:00 p.m. CDT. They also can network with fellow engineers in Q&A forums and explore the fully-staffed exhibitor area where they can interact with representatives at the different booths.
To register for the free 2009 Virtual Automated Test Summit, visit www.ni.com/testsummit.
About National Instruments
National Instruments (www.ni.com) is transforming the way engineers and scientists design, prototype and deploy systems for measurement, automation and embedded applications. NI empowers customers with off-the-shelf software such as NI LabVIEW and modular cost-effective hardware, and sells to a broad base of more than 30,000 different companies worldwide, with no one customer representing more than 3 percent of revenue and no one industry representing more than 10 percent of revenue. Headquartered in Austin, Texas, NI has more than 5,000 employees and direct operations in more than 40 countries. For the past 10 years, FORTUNE magazine has named NI one of the 100 best companies to work for in America.
